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US Patent Issued to BOE Technology Group on July 14 for "Methods for generating correction function, image correction methods and apparatuses" (Chinese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,437, issued on July 14, was assigned to BOE Technology Group Co. Ltd. (Beijing). "Methods for generating correction function, image correct... Read More


US Patent Issued to The Board of Trustees of the Leland Stanford Junior University on July 14 for "Systems and methods for automated clinical image quality assessment" (California Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,438, issued on July 14, was assigned to The Board of Trustees of the Leland Stanford Junior University (Stanford, Calif.). "Systems and met... Read More


US Patent Issued to SHANDONG GOLDEN EMPIRE PRECISION MACHINERY TECHNOLOGY on July 14 for "Window inspecting method and device for bearing holder" (Chinese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,439, issued on July 14, was assigned to SHANDONG GOLDEN EMPIRE PRECISION MACHINERY TECHNOLOGY Co. LTD (Liaocheng, China). "Window inspectin... Read More


US Patent Issued to Aptiv Technologies on July 14 for "Method for detecting artifacts in infrared (IR) illuminated IR images" (Polish Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,440, issued on July 14, was assigned to Aptiv Technologies AG (Schaffhausen, Switzerland). "Method for detecting artifacts in infrared (IR)... Read More


US Patent Issued to KLA on July 14 for "Implementing image enhancement for improved defect detection" (Indian, British, Belgian Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,441, issued on July 14, was assigned to KLA Corp. (Milpitas, Calif.). "Implementing image enhancement for improved defect detection" was in... Read More


US Patent Issued to Hitachi High-Tech on July 14 for "Inspection system for detecting foreign material and scratch at edge of semiconductor wafer and non-transitory computer-readable medium storing a program for same" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,442, issued on July 14, was assigned to Hitachi High-Tech Corp. (Tokyo). "Inspection system for detecting foreign material and scratch at e... Read More


US Patent Issued on July 14 for "Inspection methods for small bore pipes" (British Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,443, issued on July 14. "Inspection methods for small bore pipes" was invented by Dayi Zhang (Glasgow, Great Britain), Gordon Ian Dobie (Du... Read More


US Patent Issued to Canon Virginia on July 14 for "Plant detection and display system" (Virginia Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,444, issued on July 14, was assigned to Canon Virginia Inc. (Newport News, Va.). "Plant detection and display system" was invented by Hunte... Read More


US Patent Issued to CNH Industrial America on July 14 for "System and method for detecting worn, damaged, or missing agricultural implement components using a UAV" (Pennsylvania Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,445, issued on July 14, was assigned to CNH Industrial America LLC (New Holland, Pa.). "System and method for detecting worn, damaged, or m... Read More


US Patent Issued to LG Energy Solution on July 14 for "Non-destructive wire bonding inspection method" (South Korean Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,446, issued on July 14, was assigned to LG Energy Solution Ltd. (Seoul, South Korea). "Non-destructive wire bonding inspection method" was ... Read More